X-ray investigation of thin films of lead-silicate glasses

被引：0
|
作者：
Kanunnikova, OM [1 ]
Gilmutdinov, FZ [1 ]
Kozhevnikov, VI [1 ]
Sorokina, MF [1 ]
机构：
[1] RUSSIAN ACAD SCI,URALS BRANCH,MOSCOW 117901,RUSSIA
来源：
GLASS AND CERAMICS | 1995年 / 52卷 / 11-12期
关键词：
D O I：
10.1007/BF00679289
中图分类号：
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
The methods of x-ray and electron spectroscopy are used to investigate films of quartz and lead-silicate glasses with a thickness of 200 - 3000 Angstrom. The composition of the films differs from that of massive specimens used for spray-coating. The films are depleted of PbO and the depletion is higher the greater the thickness of the film.
引用
收藏
页码：331 / 332
页数：2
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