HIGH-RESOLUTION ELECTRON-MICROSCOPY OF IMAGES OF ATOMS IN SILICON CRYSTAL ORIENTED IN (110)

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|

作者：

IZUI, K ^{[1
]}

FURUNO, S ^{[1
]}

NISHIDA, T ^{[1
]}

OTSU, H ^{[1
]}

KUWABARA, S ^{[1
]}

机构：

[1] SAGA UNIV,FAC ELECTR,SAGA 840,JAPAN

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1978年 / 27卷 / 03期

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中图分类号：

TH742 [显微镜];

学科分类号：

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页码：171 / 179

页数：9

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