SPECIATION AT TRACE LEVELS BY HELIUM MICROWAVE-INDUCED PLASMA EMISSION-SPECTROMETRY

被引：28

作者：

BAUER, CF ^{[1
]}

NATUSCH, DFS ^{[1
]}

机构：

[1] COLORADO STATE UNIV,DEPT CHEM,FT COLLINS,CO 80523

来源：

ANALYTICAL CHEMISTRY | 1981年 / 53卷 / 13期

关键词：

D O I：

10.1021/ac00236a017

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：2020 / 2027

页数：8

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