REFLECTION IMAGING USING A SCANNING-TRANSMISSION ELECTRON-MICROSCOPE

被引：0

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作者：

MILNE, RH

HOWIE, A

WALLS, MG

机构：

来源：

INSTITUTE OF PHYSICS CONFERENCE SERIES | 1988年 / 93期

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D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Combined reflection imaging and spectroscopy in the STEM provides a basis for

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页码：261 / 262

页数：2

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