CONVERGENT-BEAM IMAGING - A TRANSMISSION ELECTRON-MICROSCOPY TECHNIQUE FOR INVESTIGATING SMALL LOCALIZED DISTORTIONS IN CRYSTALS

被引：39

作者：

HUMPHREYS, CJ

MAHER, DM

FRASER, HL

EAGLESHAM, DJ

机构：

[1] AT&T BELL LABS,MURRAY HILL,NJ 07974

[2] UNIV ILLINOIS,DEPT MAT SCI & ENGN,URBANA,IL 61801

来源：

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1988年 / 58卷 / 05期

关键词：

D O I：

10.1080/01418618808209953

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：787 / 798

页数：12

共 15 条

[1] GEXSI1-X/SI STRAINED-LAYER SUPERLATTICE GROWN BY MOLECULAR-BEAM EPITAXY [J].

BEAN, JC ;

FELDMAN, LC ;

FIORY, AT ;

NAKAHARA, S ;

ROBINSON, IK .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1984, 2 (02) :436-440

[2] STRAINED-LAYER EPITAXY OF GERMANIUM-SILICON ALLOYS [J].

BEAN, JC .

SCIENCE, 1985, 230 (4722) :127-131

[3] APPLICATIONS OF MODERN MICRODIFFRACTION TO MATERIALS SCIENCE [J].

CARPENTER, RW ;

SPENCE, JCH .

JOURNAL OF MICROSCOPY-OXFORD, 1984, 136 (NOV) :165-178

[4] ON PARALLEL ILLUMINATION IN THE TRANSMISSION ELECTRON-MICROSCOPE [J].

CHRISTENSON, KK ;

EADES, JA .

ULTRAMICROSCOPY, 1986, 19 (02) :191-194

[5]

FRASER HL, 1985, I PHYS C SER, V76, P307

[6] ELASTIC RELAXATION IN TRANSMISSION ELECTRON-MICROSCOPY OF STRAINED-LAYER SUPERLATTICES [J].

GIBSON, JM ;

HULL, R ;

BEAN, JC ;

TREACY, MMJ .

APPLIED PHYSICS LETTERS, 1985, 46 (07) :649-651

[7] PRACTICAL METHOD OF 3-DIMENSIONAL SPACE-GROUP ANALYSIS USING CONVERGENT-BEAM ELECTRON-DIFFRACTION [J].

GOODMAN, P .

ACTA CRYSTALLOGRAPHICA SECTION A, 1975, 31 (NOV1) :804-&

[8] STUDY OF THIN CRYSTALLINE FILMS BY UNIVERSAL ELECTRON DIFFRACTION MICROSCOPE [J].

HASHIMOTO, H .

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1954, 9 (02) :150-161

[9]

HIRSCH PB, 1965, ELECTRON MICROSCOPY

[10]

JONES PB, 1977, P R SOC A, V354, P102

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