NEAR-FIELD OPTICAL-SCANNING MICROSCOPY WITH TUNNEL-DISTANCE REGULATION

被引：20

作者：

DURIG, U

POHL, D

ROHNER, F

机构：

来源：

IBM JOURNAL OF RESEARCH AND DEVELOPMENT | 1986年 / 30卷 / 05期

关键词：

D O I：

10.1147/rd.305.0478

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：478 / 483

页数：6

共 8 条

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[3] OPTICAL CHARACTERISTICS OF 0.1-MU-M CIRCULAR APERTURES IN A METAL-FILM AS LIGHT-SOURCES FOR SCANNING ULTRAMICROSCOPY [J].

FISCHER, UC .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1985, 3 (01) :386-390

[4]

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[5] SUBWAVELENGTH RESOLUTION FAR-INFRARED MICROSCOPY [J].

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DAVIS, JA ;

KATNIK, SM ;

OMON, E .

APPLIED OPTICS, 1985, 24 (10) :1498-1501

[6] MICROSCOPY AND PATTERN GENERATION WITH SCANNED EVANESCENT WAVES [J].

MASSEY, GA .

APPLIED OPTICS, 1984, 23 (05) :658-660

[7] OPTICAL STETHOSCOPY - IMAGE RECORDING WITH RESOLUTION LAMBDA/20 [J].

POHL, DW ;

DENK, W ;

LANZ, M .

APPLIED PHYSICS LETTERS, 1984, 44 (07) :651-653

[8]

POHL DW, 1982, Patent No. 112401

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