HIGH-PRESSURE X-RAY STUDY OF UP AND USB

被引：4

作者：

VEDEL, I

OKI, K

REDON, AM

LEGER, JM

ROSSATMIGNOD, J

VOGT, O

机构：

[1] CEN,DRF,SPH,MDN,F-38041 GRENOBLE,FRANCE

[2] SWISS FED INST TECHNOL,FESTKORPERPHYS LAB,CH-8093 ZURICH,SWITZERLAND

来源：

JOURNAL OF THE LESS-COMMON METALS | 1986年 / 121卷

关键词：

D O I：

10.1016/0022-5088(86)90524-2

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：157 / 161

页数：5

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[8] HIGH-PRESSURE X-RAY-DIFFRACTION OF CERIUM COMPOUNDS IN AN IMPROVED DIAMOND ANVIL CELL [J].

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[10] HIGH-PRESSURE INVESTIGATIONS ON UO2 AND UP [J].

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