COMBINED AUGER-ELECTRON SPECTROSCOPY AND SCANNING ELECTRON-MICROSCOPY

被引：13

作者：

ASHWELL, GWB ^{[1
]}

TODD, CJ ^{[1
]}

HECKINGBOTTOM, R ^{[1
]}

机构：

[1] PO, RES STN, LONDON NW2 7DT, ENGLAND

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1973年 / 6卷 / 05期

关键词：

D O I：

10.1088/0022-3735/6/5/011

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：435 / 438

页数：4

共 50 条

[1] INVESTIGATION OF ORTHODONTIC WIRES BY SCANNING ELECTRON-MICROSCOPY AND AUGER-ELECTRON SPECTROSCOPY
CIPRUS, V
PIRS, J
POMENIC, L
KERN, M
PRACEK, B
VACUUM, 1992, 43 (5-7) : 613 - 615
[2] AUGER-ELECTRON SPECTROSCOPY, TRANSMISSION ELECTRON-MICROSCOPY, AND SCANNING ELECTRON-MICROSCOPY STUDIES OF NB/AL/NB JOSEPHSON JUNCTION STRUCTURES
CHANG, CC
GURVITCH, M
HWANG, DM
BLONDER, CW
JOURNAL OF APPLIED PHYSICS, 1987, 61 (11) : 5089 - 5097
[3] SCANNING AUGER-ELECTRON MICROSCOPY
BROWNING, R
PRUTTON, M
PHYSICS IN TECHNOLOGY, 1979, 10 (06): : 259 - 265
[4] USE OF ANALYTICAL ELECTRON-MICROSCOPY AND AUGER-ELECTRON SPECTROSCOPY FOR EVALUATING MATERIALS
JONES, RH
BRUEMMER, SM
THOMAS, MT
BAER, DR
TRANSACTIONS OF THE AMERICAN NUCLEAR SOCIETY, 1982, 43 : 248 - 250
[5] SCANNING ELECTRON EXCITED AUGER-ELECTRON SPECTROSCOPY
HAAS, TW
GRANT, JT
APPLIED SURFACE SCIENCE, 1979, 2 (02) : 322 - 334
[6] PROBLEMS OF SCANNING AUGER-ELECTRON MICROSCOPY
FRANK, L
VACUUM, 1991, 42 (1-2) : 147 - 150
[7] SURFACE STUDY OF FERROELECTRIC DOMAINS ON GASH SINGLE-CRYSTALS BY SCANNING ELECTRON-MICROSCOPY AND AUGER-ELECTRON SPECTROSCOPY
LEBIHAN, R
JOUET, G
FERROELECTRICS, 1980, 26 (1-4) : 843 - 846
[8] AUGER-ELECTRON SPECTROSCOPY IN SCANNING ELECTRON-MICROSCOPE
WALDROP, JR
MARCUS, HL
JOURNAL OF TESTING AND EVALUATION, 1973, 1 (03) : 194 - 201
[9] BACKSCATTERED ELECTRON IMAGING WITH SCANNING AUGER-ELECTRON SPECTROSCOPY
THOMAS, JH
REVIEW OF SCIENTIFIC INSTRUMENTS, 1983, 54 (10): : 1289 - 1291
[10] SYNCHRONOUS MODULATION IN SCANNING AUGER-ELECTRON MICROSCOPY
GOTO, K
ICHIMURA, S
SHIMIZU, R
REVIEW OF SCIENTIFIC INSTRUMENTS, 1979, 50 (01): : 46 - 47

← 1 2 3 4 5 →