THE SYSTEM BI2O3-SIO2

被引：22

作者：

TAKAMORI, T

机构：

[1] Thomas J. Watson Research Center, Ibm Research Division, Yorktown Heights, New York

来源：

JOURNAL OF THE AMERICAN CERAMIC SOCIETY | 1990年 / 73卷 / 01期

关键词：

bismuth oxide; differential thermal analysis; phase diagrams; silica; X‐ray diffraction;

D O I：

10.1111/j.1151-2916.1990.tb05112.x

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The Bi2O3‐rich side of the system Bi2O3‐SiO2 was studied with powder X‐ray diffraction and differential thermal analysis. In the composition 6Bi2O3. xSiO2, the metastable γ phase (bcc) was observed to exist over the range of 0 < x≤ 1. In most of the compositions studied, metastable phases of water‐quenched melts transformed into another metastable phase before reaching stable phases. A modification of the phase diagram is proposed. Copyright © 1990, Wiley Blackwell. All rights reserved

引用

页码：158 / 160

页数：3

共 7 条

[1] UBER WISMUTOXIDE .3. DIE KRISTALLSTRUKTUR DER HOCHTEMPERATURMODIFIKATION VON WISMUT(III)-OXID (DELTA-BI2O3) [J].

GATTOW, G ;

SCHRODER, H .

ZEITSCHRIFT FUR ANORGANISCHE UND ALLGEMEINE CHEMIE, 1962, 318 (3-4) :176-189

[2] COMPOSITION OF CRYSTALS OF BISMUTH SILICON-OXIDE [J].

HILL, OF ;

BRICE, JC .

JOURNAL OF MATERIALS SCIENCE, 1974, 9 (08) :1252-1254

[3]

ITO S, 1977, B I CHEM RES KYOTO U, V55, P447

[4] POLYMORPHISM OF BISMUTH SESQUIOXIDE .I. PURE BI2O3 [J].

LEVIN, EM ;

ROTH, RS .

JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY, 1964, A 68 (02) :189-+

[5] POLYMORPHISM OF BISMUTH SESQUIOXIDE .2. EFFECT OF OXIDE ADDITIONS ON POLYMORPHISM OF BI2O3 [J].

LEVIN, EM ;

ROTH, RS .

JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY, 1964, A 68 (02) :197-+

[6] POLARIZATION PROPERTIES OF PHOTOREFRACTIVE DIFFRACTION IN ELECTROOPTIC AND OPTICALLY-ACTIVE SILLENITE CRYSTALS (BRAGG REGIME) [J].

MARRAKCHI, A ;

JOHNSON, RV ;

TANGUAY, AR .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 1986, 3 (02) :321-336

[7] CZOCHRALSKI GROWTH OF OPTICAL QUALITY BISMUTH SILICON-OXIDE (BI12SIO20) [J].

TANGUAY, AR ;

MROCZKOWSKI, S ;

BARKER, RC .

JOURNAL OF CRYSTAL GROWTH, 1977, 42 (DEC) :431-434

← 1 →