TESTING CONTAMINATED INSULATORS AT PROJECT UHV FOR VOLTAGE LEVELS OF THE FUTURE

被引：3
|
作者：
LLOYD, KJ
机构：
来源：
IEEE TRANSACTIONS ON ELECTRICAL INSULATION | 1981年 / 16卷 / 03期
关键词：
D O I：
10.1109/TEI.1981.298420
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：220 / 223
页数：4
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