TESTING CONTAMINATED INSULATORS AT PROJECT UHV FOR VOLTAGE LEVELS OF THE FUTURE

被引：3

作者：

LLOYD, KJ

机构：

来源：

IEEE TRANSACTIONS ON ELECTRICAL INSULATION | 1981年 / 16卷 / 03期

关键词：

D O I：

10.1109/TEI.1981.298420

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：220 / 223

页数：4

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