RELIABILITY-ANALYSIS OF A 2-UNIT REDUNDANT SYSTEM WITH A REPLACEABLE REPAIR FACILITY

被引：0

作者：

GUO, TD ^{[1
]}

CAO, JH ^{[1
]}

机构：

[1] CHINESE ACAD SCI,INST APPL MATH,BEIJING,PEOPLES R CHINA

来源：

MICROELECTRONICS AND RELIABILITY | 1992年 / 32卷 / 09期

关键词：

D O I：

10.1016/0026-2714(92)90646-3

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper considers a two-unit redundant system where the repair facility is subject to failure and can be replaced by a new one when it fails. By using Markov renewal theory we obtain some reliability quantities of the system and the repair facility, respectively.

引用

页码：1237 / 1240

页数：4

共 6 条

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[3]

Cao JH., 1986, INTRO RELIABILITY MA

[4]

CAO JH, 1985, J MATH RES EXPOSIT, V5, P93

[5]

Gaver D., 1963, IEEE T RELIAB, VR-12, DOI [10.1109/TR.1963.5218202, DOI 10.1109/TR.1963.5218202]

[6] STOCHASTIC BEHAVIOR OF 2-UNIT PARALLELED REDUNDANT SYSTEMS WITH REPAIR MAINTENANCE [J].

NAKAGAWA, T ;

OSAKI, S .

MICROELECTRONICS AND RELIABILITY, 1975, 14 (5-6) :457-461

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