ELECTRON-DIFFRACTION STUDIES OF STRAIN IN EPITAXIAL BICRYSTALS AND MULTILAYERS

被引：51
作者：
CHERNS, D
KIELY, CJ
PRESTON, AR
机构：
来源：
ULTRAMICROSCOPY | 1988年 / 24卷 / 04期
关键词：
D O I：
10.1016/0304-3991(88)90127-1
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：355 / 370
页数：16
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