ANOMALOUS TRANSMISSION OF X-RAYS SCATTERED BY PHONONS IN A GERMANIUM CRYSTAL

被引:5
作者
KASHIWASE, Y [1 ]
MORI, M [1 ]
KOGISO, M [1 ]
USHIDA, K [1 ]
MINOURA, M [1 ]
ISHIKAWA, T [1 ]
SASAKI, S [1 ]
机构
[1] NATL LAB HIGH ENERGY PHYS,TSUKUBA,IBARAKI 305,JAPAN
关键词
D O I
10.1103/PhysRevLett.62.925
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:925 / 928
页数:4
相关论文
共 10 条
[1]   TAILLESS X-RAY SINGLE-CRYSTAL REFLECTION CURVES OBTAINED BY MULTIPLE REFLECTION - (SI GE CRYSTALS - E/T) [J].
BONSE, U ;
HART, M .
APPLIED PHYSICS LETTERS, 1965, 7 (09) :238-&
[2]  
Borrmann G, 1941, PHYS Z, V42, P157
[3]  
BUSHUEV VA, 1983, FIZ TVERD TELA+, V25, P228
[4]   RESOLUTION FUNCTION OF AN X-RAY TRIPLE-CRYSTAL DIFFRACTOMETER [J].
COWLEY, RA .
ACTA CRYSTALLOGRAPHICA SECTION A, 1987, 43 :825-836
[5]   X-RAY BRILLOUIN-SCATTERING [J].
EISENBERGER, P ;
ALEXANDROPOULOS, NG ;
PLATZMAN, PM .
PHYSICAL REVIEW LETTERS, 1972, 28 (23) :1519-+
[6]   SEPARATE MEASUREMENTS OF DYNAMICAL AND KINEMATICAL X-RAY DIFFRACTIONS FROM SILICON-CRYSTALS WITH A TRIPLE CRYSTAL DIFFRACTOMETER [J].
IIDA, A ;
KOHRA, K .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1979, 51 (02) :533-542
[7]   HIGH-PRECISION GONIOMETER SYSTEM FOR TOPOGRAPHY AND DIFFRACTOMETRY USING MULTIPLE CRYSTAL ARRANGEMENT [J].
ISHIKAWA, T ;
MATSUI, J ;
KITANO, T .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1986, 246 (1-3) :613-616
[8]   DIFFRACTION PATTERN CAUSED BY X-RAY THERMAL DIFFUSE-SCATTERING IN ABSORBING PERFECT CRYSTAL [J].
KASHIWASE, Y ;
MORI, M ;
KOGISO, M ;
MINOURA, M ;
SASAKI, S .
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1988, 57 (02) :524-534
[9]  
KASHIWASE Y, 1986 NAT LAB HIGH EN, P166
[10]   HIGH-RESOLUTION MEASUREMENTS OF ANGLE-RESOLVED X-RAY-SCATTERING FROM OPTICALLY FLAT MIRRORS [J].
MATSUSHITA, T ;
ISHIKAWA, T ;
KOHRA, K .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1984, 17 (AUG) :257-264