HERSTELLUNG UND ANALYSE VON SIO-AUFDAMPFSCHICHTEN VERSCHIEDENER OPTISCHER EIGENSCHAFTEN

被引：9
作者：
CREMER, E
PULKER, H
机构：
来源：
MONATSHEFTE FUR CHEMIE | 1962年 / 93卷 / 02期
关键词：
D O I：
10.1007/BF00903147
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
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页码：491 / &
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共 12 条
[1]  
Bonhoeffer KF, 1928, Z PHYS CHEM-STOCH VE, V131, P363
[2]  
BREWER J, 1954, J PHYS CHEM, V58, P351
[3]  
CREMER E, 1958, Z ELEKTROCHEM, V62, P939
[4]   NACHWEIS DES SILICIUMOXYDS SI2O3 [J].
CREMER, E ;
FAESSLER, A ;
KRAMER, H .
NATURWISSENSCHAFTEN, 1959, 46 (11) :377-377
[5]  
FAESSLER A, 1959, ANN PHYS, V4, P263
[6]   OPTICAL PROPERTIES OF SILICON MONOXIDE IN THE WAVELENGTH REGION FROM 0.24 TO 14.0 MICRONS [J].
HASS, G ;
SALZBERG, CD .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1954, 44 (03) :181-187
[7]   PREPARATION, STRUCTURE, AND APPLICATIONS OF THIN FILMS OF SILICON MONOXIDE AND TITANIUM DIOXIDE [J].
HASS, G .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1950, 33 (12) :353-360
[8]   INFRARED PROPERTIES OF SILICON MONOX AND EVAPORATED SIO FILMS [J].
HOWARTH, LE ;
SPITZER, WG .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1961, 44 (01) :26-28
[9]  
KONIG H, 1948, OPTIK, V3, P419
[10]  
PULKER H, 1961, THESIS INNSBRUCK
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