TECHNIQUE FOR HANDLING AND MOUNTING FINE PARTICLES FOR ELECTRON MICROSCOPE EXAMINATION

被引：2

|

作者：

MORELOCK, CR

HOLIK, AS

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1962年 / 33卷 / 01期

关键词：

D O I：

10.1063/1.1717641

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

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页码：125 / &

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