SABATPG - A STRUCTURAL-ANALYSIS BASED AUTOMATIC TEST-GENERATION SYSTEM

被引：0

作者：

LI, ZC

PAN, YQ

MIN, YH

机构：

来源：

SCIENCE IN CHINA SERIES A-MATHEMATICS PHYSICS ASTRONOMY | 1994年 / 37卷 / 09期

关键词：

TEST GENERATION; SENSITIZATION; IMPLICATION; UNDETECTABLE FAULT;

D O I：

暂无

中图分类号：

O29 [应用数学];

学科分类号：

070104 ;

摘要：

A TPG system, SABATPG, is given based on a generic structural model of large circuits. Three techniques of partial implication, aftereffect of identified undetectable faults and shared sensitization with new concepts of localization and aftereffect are employed in the system to improve FAN algorithm Experiments for the 10 ISCAS benchmark circuits show that the computing time of SABATPG for test generation is 19.42% less than that of FAN algorithm.

引用

页码：1104 / 1114

页数：11

共 11 条

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