ION SCATTERING ANALYSIS OF COPPER-FILMS OXIDIZED IN O-18

被引:18
作者
CZANDERNA, AW
MILLER, AC
JELLINEK, HHG
KACHI, H
机构
[1] CLARKSON COLL TECHNOL, INST COLLOID & SURFACE SCI, DEPT PHYS, POTSDAM, NY 13676 USA
[2] CLARKSON COLL TECHNOL, INST COLLOID & SURFACE SCI, DEPT CHEM, POTSDAM, NY 13676 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1977年 / 14卷 / 01期
关键词
D O I
10.1116/1.569127
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:227 / 230
页数:4
相关论文
共 14 条
[1]   MECHANISM OF OXIDATION AT A COPPER-POLYETHYLENE INTERFACE .2. PENETRATION OF COPPER IONS IN POLYETHYLENE MATRIX [J].
ALLARA, DL ;
WHITE, CW ;
MEEK, RL ;
BRIGGS, TH .
JOURNAL OF POLYMER SCIENCE PART A-POLYMER CHEMISTRY, 1976, 14 (01) :93-104
[2]   REDUCTION OF CUO0.67 IN HYDROGEN [J].
CZANDERN.AW .
JOURNAL OF PHYSICAL CHEMISTRY, 1965, 69 (10) :3607-&
[3]   DEPTH PROFILES OF AU OVERLAYERS ON AG FILMS [J].
CZANDERNA, AW ;
SUMMERMATTER, R .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (01) :384-387
[4]  
CZANDERNA AW, 1975, METHODS SURFACE ANAL, pCH1
[5]  
CZANDERNA AW, 1975, 224 INT COPP RES ASS
[6]  
CZANDERNA AW, UNPUBLISHED RESULT
[7]   SURFACE COMPOSITION ANALYSIS BY BINARY SCATTERING OF NOBLE GAS IONS [J].
GOFF, RF ;
SMITH, DP .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1970, 7 (01) :72-+
[8]  
HANSEN RH, 1970, THERMAL STABILITY PO, P153
[9]   ANALYSIS OF MATERIALS BY ELECTRON-EXCITED AUGER ELECTRONS [J].
HARRIS, LA .
JOURNAL OF APPLIED PHYSICS, 1968, 39 (03) :1419-&
[10]   SPUTTERING OF SURFACES BY POSITIVE ION BEAMS OF LOW ENERGY [J].
HONIG, RE .
JOURNAL OF APPLIED PHYSICS, 1958, 29 (03) :549-555