SCANNING MAGNETIC-FORCE MICROSCOPE

被引：0
|
作者：
VOLODIN, AP [1 ]
MARCHEVSKII, MV [1 ]
KHAIKIN, MS [1 ]
机构：
[1] MOSCOW STEEL & ALLOYS INST,MOSCOW,USSR
来源：
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES | 1991年 / 34卷 / 02期
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
A scanning microscope with a ferromagnetic probe for study of the magnetic structure of specimen surfaces is described. The instrument records the force of magnetic interaction (10(-9)-10(-10) N) of the nickel tip with the surface as a bivariate function of its coordinates in the plane of the specimen surface. A tunneling sensor is used to measure the deflection of the elastic element of the probe caused by this force. The resolution of the microscope is better than 100 nm. The instrument operates at low temperatures (< 78 K).
引用
收藏
页码：413 / 418
页数：6
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