SCANNING TUNNELING MICROSCOPY (STM) OF SEMICONDUCTOR SURFACES AND METAL-SEMICONDUCTOR INTERFACES

被引：6
作者：
SALVAN, F
HUMBERT, A
DUMAS, P
THIBAUDAU, F
机构：
来源：
ANNALES DE PHYSIQUE | 1988年 / 13卷 / 03期
关键词：
D O I：
10.1051/anphys:01988001303013300
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：133 / 152
页数：20
相关论文
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