共 50 条
- [34] Characterization of residual stress in metallic films on silicon with micromechanical devices MICROMACHINING AND MICROFABRICATION PROCESS TECHNOLOGY II, 1996, 2879 : 126 - 134
- [35] Calibration of residual stress difference of MetalMUMPs silicon nitride films Microsystem Technologies, 2010, 16 : 625 - 632
- [36] Correlation between microstructure and residual stress of nanocrystalline silicon films PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 7 NO 3-4, 2010, 7 (3-4): : 628 - 631
- [37] Calibration of residual stress difference of MetalMUMPs silicon nitride films MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS, 2010, 16 (04): : 625 - 632
- [38] Residual stress of silicon films deposited by LPCVD from silane MICROELECTROMECHANICAL STRUCTURES FOR MATERIALS RESEARCH, 1998, 518 : 209 - 214