STUDY OF THE POSITION-SENSITIVE DETECTION OF X-RAYS WITH A SILICON DRIFT CHAMBER

被引：1
作者：
SCHOONEVELD, EM
VANEIJK, CWE
HOLLANDER, RW
HIJZEN, EA
机构：
[1] Radiation Technology Group, Department of Applied Physics, Delft University of Technology, Delft the
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1993年 / 326卷 / 1-2期
关键词：
D O I：
10.1016/0168-9002(93)90361-K
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A silicon drift chamber (SDC) is an attractive device for the position-sensitive detection of low-energy radiation. In case of X-ray detection the start signal has to be generated internally. Results of computer simulations are presented showing that in a p-type SDC the influence of the variation in the rise time of the start signal on the position resolution is much smaller than in an n-type SDC. Furthermore, calculations show that in both cases, the noise contribution to the position resolution is much more important. Again in a p-type detector the influence of the noise is smaller than in an n-type SDC. The conclusion seems justified that for position-sensitive detection of X-rays the use of a p-type SDC is preferable.
引用
收藏
页码：263 / 266
页数：4
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