STUDY OF THE POSITION-SENSITIVE DETECTION OF X-RAYS WITH A SILICON DRIFT CHAMBER

被引：1

作者：

SCHOONEVELD, EM

VANEIJK, CWE

HOLLANDER, RW

HIJZEN, EA

机构：

[1] Radiation Technology Group, Department of Applied Physics, Delft University of Technology, Delft the

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1993年 / 326卷 / 1-2期

关键词：

D O I：

10.1016/0168-9002(93)90361-K

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A silicon drift chamber (SDC) is an attractive device for the position-sensitive detection of low-energy radiation. In case of X-ray detection the start signal has to be generated internally. Results of computer simulations are presented showing that in a p-type SDC the influence of the variation in the rise time of the start signal on the position resolution is much smaller than in an n-type SDC. Furthermore, calculations show that in both cases, the noise contribution to the position resolution is much more important. Again in a p-type detector the influence of the noise is smaller than in an n-type SDC. The conclusion seems justified that for position-sensitive detection of X-rays the use of a p-type SDC is preferable.

引用

页码：263 / 266

页数：4

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