XPS MEASUREMENTS AND STRUCTURAL ASPECTS OF SILICATE AND PHOSPHATE-GLASSES

被引：196

作者：

BRUCKNER, R

CHUN, HU

GORETZKI, H

SAMMET, M

机构：

[1] PERKIN ELMER PHYS ELECTR,MUNCHEN,FED REP GER

[2] UNIV FRANKFURT,INST PHYS CHEM,D-6000 FRANKFURT 70,FED REP GER

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 1980年 / 42卷 / 1-3期

关键词：

D O I：

10.1016/0022-3093(80)90007-1

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：49 / 60

页数：12

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[9] X-RAY SPECTROSCOPIC INVESTIGATION OF STRUCTURE OF SILICA, SILICATES AND OXIDES IN CRYSTALLINE AND VITREOUS STATE [J].

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[10] CORE BINDING ENERGY DIFFERENCE BETWEEN BRIDGING AND NONBRIDGING OXYGEN ATOMS IN A SILICATE CHAIN [J].

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