RAMAN MICROPROBE SPECTROSCOPY OF ICING ON METAL-SURFACES

被引:11
作者
SONWALKAR, N
SUNDER, SS
SHARMA, SK
机构
[1] MIT,ROOM 1-274,77 MASSACHUSETTS AVE,CAMBRIDGE,MA 02139
[2] HAWAII INST GEOPHYS,HONOLULU,HI 96822
关键词
D O I
10.1002/jrs.1250221003
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
A simple optical low-temperature icing cell was fabricated to obtain the in situ Raman spectra of ice layers forming on metallic substrates. The icing cell is optically coupled to a micro Raman multi-channel spectrometer. The Raman spectra of the initial ice layers show characteristics of a disordered phase resembling low-density amorphous ice. The crystalline phase develops gradually as the thickness of the ice layer increases. The disorder in the initial ice layer may be caused primarily by the rapid thermal cooling, and appears to be independent of the type of metal substrate.
引用
收藏
页码:551 / 557
页数:7
相关论文
共 34 条
[1]  
ATWATER H, 1987, THESIS MIT CAMBRIDGE
[2]   ADHESION OF ICE TO LUBRICATED SURFACES [J].
BAKER, HR ;
BASCOM, WD ;
SINGLETERRY, CR .
JOURNAL OF COLLOID SCIENCE, 1962, 17 (05) :477-&
[3]   OPTICAL SPECTRA OF ORIENTATIONALLY DISORDERED CRYSTALS .2. INFRARED SPECTRUM OF ICE IH AND ICE IC FROM 360 TO 50 CM-1 [J].
BERTIE, JE ;
WHALLEY, E .
JOURNAL OF CHEMICAL PHYSICS, 1967, 46 (04) :1271-&
[4]   RAMAN MEASUREMENTS OF STRESS IN SILICON-ON-SAPPHIRE DEVICE STRUCTURES [J].
BRUECK, SRJ ;
TSAUR, BY ;
FAN, JCC ;
MURPHY, DV ;
DEUTSCH, TF ;
SILVERSMITH, DJ .
APPLIED PHYSICS LETTERS, 1982, 40 (10) :895-898
[5]  
CLARKE DR, 1983, ADV MATERIALS CHARAC, P199
[6]  
CROSS DC, 1937, J AM CHEM SOC, V59, P1134
[7]   DETERMINATION OF EXISTING STRESS IN SILICON FILMS ON SAPPHIRE SUBSTRATE USING RAMAN-SPECTROSCOPY [J].
ENGLERT, T ;
ABSTREITER, G ;
PONTCHARRA, J .
SOLID-STATE ELECTRONICS, 1980, 23 (01) :31-33
[8]   RAMAN-SCATTERING AS A PROBE OF STRUCTURAL PHASE-TRANSITIONS IN THE INTERCALATED GRAPHITE-BROMINE SYSTEM [J].
ERBIL, A ;
DRESSELHAUS, G ;
DRESSELHAUS, MS .
PHYSICAL REVIEW B, 1982, 25 (08) :5451-5460
[9]  
FRANK SH, 1970, SCIENCE, V169, P635
[10]  
GABRICHI.ZA, 1965, OPT SPECTROSC-USSR, V19, P319