PROCESS TEST CHIP FOR JOSEPHSON INTEGRATED-CIRCUITS

被引：4
作者：
KLEPNER, SP
机构：
来源：
IEEE TRANSACTIONS ON MAGNETICS | 1981年 / 17卷 / 01期
关键词：
D O I：
10.1109/TMAG.1981.1060966
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：282 / 285
页数：4
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