QUICK SCANNING EXAFS - 1ST EXPERIMENTS

被引:161
作者
FRAHM, R
机构
关键词
D O I
10.1016/0168-9002(88)90732-2
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:578 / 581
页数:4
相关论文
共 8 条
[1]   X-RAY ABSORPTION-SPECTROSCOPY IN DISPERSIVE MODE AND BY TOTAL REFLECTION [J].
DARTYGE, E ;
FONTAINE, A ;
TOURILLON, G ;
CORTES, R ;
JUCHA, A .
PHYSICS LETTERS A, 1986, 113 (07) :384-388
[2]   X-RAY ABSORPTION IN DISPERSIVE MODE - A NEW SPECTROMETER AND A DATA ACQUISITION-SYSTEM FOR FAST KINETICS [J].
DARTYGE, E ;
DEPAUTEX, C ;
DUBUISSON, JM ;
FONTAINE, A ;
JUCHA, A ;
LEBOUCHER, P ;
TOURILLON, G .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1986, 246 (1-3) :452-460
[3]   EXAFS STUDIES OF THE LOCAL ORDER IN AMORPHOUS AND CRYSTALLINE NICKEL-ZIRCONIUM ALLOYS .1. PRINCIPLES AND EVALUATION OF THE CRYSTALLINE ALLOYS [J].
FRAHM, R ;
HAENSEL, R ;
RABE, P .
JOURNAL OF PHYSICS F-METAL PHYSICS, 1984, 14 (04) :1029-1046
[4]   EXTENDED X-RAY ABSORPTION FINE-STRUCTURE - ITS STRENGTHS AND LIMITATIONS AS A STRUCTURAL TOOL [J].
LEE, PA ;
CITRIN, PH ;
EISENBERGER, P ;
KINCAID, BM .
REVIEWS OF MODERN PHYSICS, 1981, 53 (04) :769-806
[5]   A FAST X-RAY ABSORPTION SPECTROMETER FOR USE WITH SYNCHROTRON RADIATION [J].
MATSUSHITA, T ;
PHIZACKERLEY, RP .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1981, 20 (11) :2223-2228
[6]  
OYANAGI H, 1986, J PHYS PARIS, P139
[7]   AN ENERGY-DISPERSIVE SPECTROMETER FOR THE RAPID MEASUREMENT OF X-RAY ABSORPTION-SPECTRA USING SYNCHROTRON RADIATION [J].
PHIZACKERLEY, RP ;
REK, ZU ;
STEPHENSON, GB ;
CONRADSON, SD ;
HODGSON, KO ;
MATSUSHITA, T ;
OYANAGI, H .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1983, 16 (APR) :220-232
[8]  
Teo B., 1986, EXAFS BASIC PRINCIPL