Passivation properties of SiNx and SiO2 thin films for the application of crystalline Si solar cells

被引:2
|
作者
Jeong, Myung-Il [1 ]
Choi, Chel-Jong [1 ]
机构
[1] Chonbuk Natl Univ, SPRC, Sch Semicond & Chem Engn, Jeonju 561756, South Korea
来源
JOURNAL OF THE KOREAN CRYSTAL GROWTH AND CRYSTAL TECHNOLOGY | 2014年 / 24卷 / 01期
关键词
SiNx; SiO2; Passivation; Crystalline Si solar cells; Interface trap density;
D O I
10.6111/JKCGCT.2014.24.1.041
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
We have investigated the passivation property of SiNx and SiO2 thin films formed using various process conditions for the application of crystalline Si solar cells. An increase in the thickness of SiNx deposited using plasma enhanced chemical vapor deposition (PECVD) led to the improvement of passivation quality. This could be associated with the passivation of Si dangling bonds by hydrogen atoms which were supplied during PECVD deposition. The SiO2 thin films grown using dry oxidation process exhibited better passivation behavior than those using wet oxidation process, implying the dry oxidation process was more effective in the formation of high quality SiO2 thin films. The relative effective life time gradually decreased with increasing dry oxidation temperature. Such a degradation of passivation behavior could be attributed to the increase in interface trap density caused by thermal damages.
引用
收藏
页码:41 / 45
页数:5
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