DEVICE FOR DETERMINATION OF CHARGED-PARTICLE BEAM PROFILE AND POSITION

被引：5

作者：

PRUDNIKO.IA ^{[1
]}

TOROPOV, AS ^{[1
]}

CHICHIKA.YF ^{[1
]}

KHOKHRYA.IV ^{[1
]}

机构：

[1] DV EFREMOV SCI RES ELECTROPHYS APPARAT INST,LENINGRAD,USSR

来源：

NUCLEAR INSTRUMENTS & METHODS | 1974年 / 114卷 / 01期

关键词：

D O I：

10.1016/0029-554X(74)90336-X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：101 / 104

页数：4

共 8 条

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[3] BEAM PROFILE MEASUREMENT FOR ELECTRON ACCELERATORS [J].

OKABE, S ;

TABATA, T ;

TSUMORI, K .

JAPANESE JOURNAL OF APPLIED PHYSICS, 1966, 5 (01) :68-&

[4] A 10-CHANNEL SECUNDARY EMISSION MONITOR FOR ELECTRON BEAM ANALYZING PURPOSES [J].

PICENI, HAL ;

DEVRIES, C .

NUCLEAR INSTRUMENTS & METHODS, 1967, 51 (01) :87-&

[5]

RAQUET E, 1969, DESY6912 REP

[6]

RIGAN J, 1966, REV SCI INSTR, V37, P1190

[7]

VJALITSIN VA, 1967, PRIBORI TEHNIKA EKSP, P36

[8]

VONILLOT IM, 1971, CERNISROP7154 REP

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