TEM AND SEM STUDIES OF EPITAXIAL YBA2CU3O7-X SUPERCONDUCTING THIN-FILMS

被引：0

作者：

LI, YJ ^{[1
]}

REN, CX ^{[1
]}

CHEN, GL ^{[1
]}

ZOU, SC ^{[1
]}

机构：

[1] ACAD SINICA,SHANGHAI INST MET,ION BEAM LAB,SHANGHAI 200050,PEOPLES R CHINA

来源：

SCIENCE IN CHINA SERIES A-MATHEMATICS PHYSICS ASTRONOMY | 1993年 / 36卷 / 07期

关键词：

YBA2CU3O7-X; EPITAXIAL GROWTH; HREM; DEFECTS;

D O I：

暂无

中图分类号：

O29 [应用数学];

学科分类号：

070104 ;

摘要：

The microstructure of high-T(c) epitaxial YBCO superconducting thin films have been investigated using high-resolution transmission electron microscopy and scanning electron microscopy. It is found that the epitaxial growth of the film is closely related to not only deposition conditions, but also the surface quality of the substrate. The experimental results show that in epitaxial YBCO superconducting thin films grown on (100) SrTiO3 single crystal substrates, the interface layer, defects, and undesirable orientations are the main elements which degrade the critical current density J(c) of the film.

引用

页码：882 / 887

页数：6

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