AMORPHIZATION REACTIONS IN MULTILAYERED THIN FE/ZR FILMS STUDIED BY MAGNETIC, X-RAY AND DSC MEASUREMENTS

被引:13
作者
KRAEGERMANN, S
STOBIECKI, F
STOBIECKI, T
ROLL, K
机构
[1] STANISLAW STASZIC UNIV MIN & MET,INST ELECTR,PL-30059 KRAKOW,POLAND
[2] POLISH ACAD SCI,INST MOLEC PHYS,PL-30059 KRAKOW,POLAND
关键词
Calorimetry - Iron And Alloys--Thin Films - X-Ray Analysis - Zirconium And Alloys--Magnetic Properties;
D O I
10.1016/0304-8853(91)90731-O
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Amorphization in multilayered thin Fe/Zr films was determined by measurements of the magnetic moment during isothermal annealing and described by a simple growth model. The diffusion coefficients were only a function of temperature and did not depend on the initial layer structure of the films.
引用
收藏
页码:209 / 210
页数:2
相关论文
共 4 条
[1]   GENERAL RELATIONSHIP FOR THERMAL OXIDATION OF SILICON [J].
DEAL, BE ;
GROVE, AS .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (12) :3770-&
[2]   SIMULTANEOUS AMORPHIZATION AT INTERFACES AND GRAIN-BOUNDARIES IN AN NI/TI MULTILAYER [J].
HOLLANDERS, MA ;
THIJSSE, BJ .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1990, 117 :696-699
[3]  
OTTO T, 1991, J MAGN MAGN MATER, V101
[4]  
STOBIECKI F, 1989, ACTA PHYS POL A, V76, P325