ON THE EFFECT OF OBJECTIVE LENS CHROMATIC ABERRATION ON QUANTITATIVE ELECTRON-ENERGY-LOSS SPECTROSCOPY (EELS)

被引:18
作者
TITCHMARSH, JM [1 ]
MALIS, TF [1 ]
机构
[1] MET TECHNOL LABS,OTTAWA,ONTARIO,CANADA
关键词
D O I
10.1016/0304-3991(89)90307-0
中图分类号
TH742 [显微镜];
学科分类号
摘要
引用
收藏
页码:277 / 282
页数:6
相关论文
共 14 条
[1]  
BUGGY TW, 1981, ANAL ELECTRON MICROS, P231
[2]  
BUGGY TW, 1982, I PHYS C SER, V61, P197
[3]  
CRAVEN AJ, 1981, QUANTITATIVE MICROAN, P141
[4]  
Egerton R.F., 1981, ANAL MICROSCOPY 1981, P235
[5]   K-SHELL IONIZATION CROSS-SECTIONS FOR USE IN MICROANALYSIS [J].
EGERTON, RF .
ULTRAMICROSCOPY, 1979, 4 (02) :169-179
[6]  
HOFER F, IN PRESS MICRON MICR
[7]   PRE-SPECTROMETER OPTICS IN A CTEM-STEM [J].
JOHNSON, DE .
ULTRAMICROSCOPY, 1980, 5 (02) :163-174
[8]   DETERMINATION OF SINGLE-SCATTERING PROBABILITY DISTRIBUTION FROM PLURAL-SCATTERING DATA [J].
JOHNSON, DW ;
SPENCE, JCH .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1974, 7 (06) :771-780
[9]   THE INFLUENCE OF OBJECTIVE LENS ABERRATIONS IN ENERGY-LOSS SPECTROMETRY [J].
KRUIT, P ;
SHUMAN, H .
ULTRAMICROSCOPY, 1985, 17 (03) :263-267
[10]   K-SHELL, L-SHELL AND M-SHELL GENERALIZED OSCILLATOR-STRENGTHS AND IONIZATION CROSS-SECTIONS FOR FAST ELECTRON COLLISIONS [J].
LEAPMAN, RD ;
REZ, P ;
MAYERS, DF .
JOURNAL OF CHEMICAL PHYSICS, 1980, 72 (02) :1232-1243