APPLICATIONS OF FACTOR-ANALYSIS TO ELECTRON AND ION-BEAM SURFACE TECHNIQUES

被引：38
作者：
SOLOMON, JS
机构：
来源：
SURFACE AND INTERFACE ANALYSIS | 1987年 / 10卷 / 2-3期
关键词：
D O I：
10.1002/sia.740100204
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：75 / 86
页数：12
相关论文
共 27 条
[1]   PRINCIPAL COMPONENT ANALYSIS AS A METHOD FOR SILICIDE INVESTIGATION WITH AUGER-ELECTRON SPECTROSCOPY [J].
ATZRODT, V ;
LANGE, H .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1983, 79 (02) :489-496
[2]   DEVELOPMENTS IN SECONDARY ION MASS-SPECTROSCOPY AND APPLICATIONS TO SURFACE STUDIES [J].
BENNINGHOVEN, A .
SURFACE SCIENCE, 1975, 53 (DEC) :596-625
[3]   SIMS STUDIES OF ADSORPTION OF O-2, CO AND CO2 ON TITANIUM USING LOW PRIMARY ENERGIES [J].
DAWSON, PH .
SURFACE SCIENCE, 1977, 65 (01) :41-&
[4]   PRINCIPAL COMPONENT ANALYSIS OF AUGER LINE-SHAPES AT SOLID-SOLID INTERFACES [J].
GAARENSTROOM, SW .
APPLIED SURFACE SCIENCE, 1981, 7 (1-2) :7-18
[5]   CHEMICAL CHARACTERIZATION FROM CARBON AUGER-SPECTRA BY APPLICATION OF PATTERN-RECOGNITION AND FACTOR-ANALYSIS [J].
GAARENSTROOM, SW .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (02) :600-604
[6]  
GAARENSTROOM SW, 1982, J VAC SCI TECHNOL, V20, P2458
[7]  
GAARENSTROOM SW, 1985, MAY S SURF ANAL THIN
[8]   APPLICATION OF FACTOR-ANALYSIS TO THE RESOLUTION OF OVERLAPPING XPS SPECTRA [J].
GILBERT, RA ;
LLEWELLYN, JA ;
SWARTZ, WE ;
PALMER, JW .
APPLIED SPECTROSCOPY, 1982, 36 (04) :428-430
[9]   FACTOR-ANALYSIS FOR SEPARATION OF PURE COMPONENT SPECTRA FROM MIXTURE SPECTRA [J].
GILLETTE, PC ;
LANDO, JB ;
KOENIG, JL .
ANALYTICAL CHEMISTRY, 1983, 55 (04) :630-633
[10]  
KAUN TS, 1983, J APPL PHYS, V54, P6952
123