4-BEAM LASER INTERFEROMETRY FOR 3-DIMENSIONAL MICROSCOPIC COORDINATE MEASUREMENT

被引:26
作者
NAKAMURA, O [1 ]
GOTO, M [1 ]
机构
[1] NATL RES LAB METROL, TSUKUBA, IBARAKI 305, JAPAN
来源
APPLIED OPTICS | 1994年 / 33卷 / 01期
关键词
LASER INTERFEROMETRY; MICROSTAGES; COORDINATE MEASUREMENT; MICROSCOPY;
D O I
10.1364/AO.33.000031
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We propose a new method for calibrating the three-dimensional (3-D) behavior of a scanning stage. Four laser interferometers are used to determine the position of the corner point of a corner mirror attached to the stage. We calculated the 3-D coordinate of the corner point by using only the length information given by the four laser interferometers; thus a method is realized that is traceable from the practical definition of length and that facilitates the optical alignment that is necessary for the interferometers. We calibrated a commercial 3-D stage by the proposed method with a coordinate accuracy of 20-30 nm.
引用
收藏
页码:31 / 36
页数:6
相关论文
共 4 条
[1]  
HOF A, 1987, VDI SERIES, V8
[2]   LASER INTERFEROMETRIC CALIBRATION OF MICROSCAN MECHANISMS BY USING 3 LASER-BEAMS [J].
NAKAMURA, O ;
GOTO, M .
PRECISION ENGINEERING-JOURNAL OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING, 1993, 15 (01) :39-43
[3]  
Nakamura O., 1991, ANN CIRP, V40, P523
[4]   LINEAR INTERPOLATION OF PERIODIC ERROR IN A HETERODYNE LASER INTERFEROMETER AT SUBNANOMETER LEVELS [J].
TANAKA, M ;
YAMAGAMI, T ;
NAKAYAMA, K .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1989, 38 (02) :552-554