COMPARISON OF SHORTWAVE AND LONGWAVE MEASURING THERMAL-IMAGING SYSTEMS

被引:22
作者
CHRZANOWSKI, K
机构
[1] Institute of Optoelectronics, Military University of Technology, Warsaw
来源
APPLIED OPTICS | 1995年 / 34卷 / 16期
关键词
THERMAL IMAGING SYSTEMS; INFRARED SYSTEMS; REMOTE TEMPERATURE MEASUREMENT;
D O I
10.1364/AO.34.002888
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A comparison study of shortwave (3-5-mu m) and longwave (8-12-mu) measuring thermal imaging systems has been conducted. The study was limited to systems working in indoor conditions, as is typical in many industrial and scientific applications. A theory of the influence of measurement conditions and system parameters on the accuracy of temperature measurements has been developed. On the basis of the developed formulas an analysis of the influence of signal disturbances (because of incorrectly assumed emissivity, radiation reflected by the object, radiation emitted by system optics, limited transmittance of the atmosphere, and limited temperature resolution of the system) on the accuracy of temperature measurement has been made. It has been found that the shortwave systems in typical measurement conditions offer generally better accuracy in temperature measurement than the longwave ones do.
引用
收藏
页码:2888 / 2897
页数:10
相关论文
共 12 条
[11]  
SCHOTT JR, 1993, P SOC PHOTO-OPT INS, V1968, P448, DOI 10.1117/12.154850
[12]  
WOLFE WL, 1989, INFRARED HDB