FAST LEED INTENSITY MEASUREMENTS WITH A VIDEO CAMERA AND A VIDEO TAPE-RECORDER

被引:43
作者
LANG, E
HEILMANN, P
HANKE, G
HEINZ, K
MULLER, K
机构
[1] Lehrstuhl für Festkörperphysik, Institut für Angewandte Physik, Erlangen
来源
APPLIED PHYSICS | 1979年 / 19卷 / 03期
关键词
06.90+v; 61.14-x; 82.65;
D O I
10.1007/BF00900472
中图分类号
O59 [应用物理学];
学科分类号
摘要
The measurement of LEED intensities with a TV camera-computer system, which has been published in an earlier paper, is reported to be improved with respect to the speed of data collection by a factor of about 102. Other properties such as sensitivity, reliability and handling facility have also been improved. The new measuring mode, which applies a video tape recorder, allows the simultaneous measurement of all appearing diffraction spots down to a beam current of 10-11 A with a rate of 50 energy points/s. This pushes the total measuring time for LEED spectra to the order of seconds and makes possible to monitor non-stable surfaces. As an example intensity measurements for different adsorption stages of hydrogen on W(100) are presented. © 1979 Springer-Verlag.
引用
收藏
页码:287 / 293
页数:7
相关论文
共 7 条
  • [1] ELASTIC LEED INTENSITY ENERGY STUDIES OF CLEAN (001), (110) AND (111) NICKEL SURFACES
    DEMUTH, JE
    RHODIN, TN
    [J]. SURFACE SCIENCE, 1974, 42 (01) : 261 - 298
  • [2] USE OF A VIDICON CAMERA FOR MEASUREMENT OF LEED BEAM INTENSITIES BY PHOTOGRAPHIC METHOD
    FROST, DC
    MITCHELL, KAR
    SHEPHERD, FR
    WATSON, PR
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (06): : 1196 - 1198
  • [3] FAST LEED-INTENSITY MEASUREMENTS WITH A COMPUTER-CONTROLLED TELEVISION SYSTEM
    HEILMANN, P
    LANG, E
    HEINZ, K
    MULLER, K
    [J]. APPLIED PHYSICS, 1976, 9 (03): : 247 - 251
  • [4] PAST AND FUTURE SURFACE CRYSTALLOGRAPHY BY LEED
    JONA, F
    [J]. SURFACE SCIENCE, 1977, 68 (01) : 204 - 220
  • [5] STRUCTURE DETERMINATION OF (100) SURFACE OF RHODIUM BY LOW-ENERGY DIFFRACTION
    MITCHELL, KAR
    SHEPHERD, FR
    WATSON, PR
    FROST, DC
    [J]. SURFACE SCIENCE, 1977, 64 (02) : 737 - 750
  • [6] NEW RAPID AND ACCURATE METHOD TO MEASURE LOW-ENERGY-ELECTRON-DIFFRACTION BEAM INTENSITIES - INTENSITIES FROM CLEAN PT (111) CRYSTAL-FACE
    STAIR, PC
    KAMINSKA, TJ
    KESMODEL, LL
    SOMORJAI, GA
    [J]. PHYSICAL REVIEW B, 1975, 11 (02): : 623 - 629
  • [7] UEDA K, 1977, 7TH P INT VAC C 3RD, P2423