A METAL DOPING EFFECT IN AN ELECTRON-BEAM SENSITIVE RESIST

被引:3
作者
YAMADA, M
HATTORI, S
机构
关键词
D O I
10.1143/JJAP.20.1969
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:1969 / 1970
页数:2
相关论文
共 4 条
[1]   MONTE-CARLO TECHNIQUE AS APPLIED TO FUNDAMENTALS OF EPMA AND SEM [J].
SHIMIZU, R ;
MURATA, K ;
IKUTA, T .
JOURNAL OF APPLIED PHYSICS, 1972, 43 (10) :4233-&
[2]   NEW FAMILY OF POSITIVE ELECTRON-BEAM RESISTS-POLY(OLEFIN SULFONES) [J].
THOMPSON, LF ;
BOWDEN, MJ .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1973, 120 (12) :1722-1726
[3]   POLYMERIC RESISTS FOR X-RAY LITHOGRAPHY [J].
THOMPSON, LF ;
FEIT, ED ;
BOWDEN, MJ ;
LENZO, PV ;
SPENCER, EG .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1974, 121 (11) :1500-1503
[4]  
YAMADA M, 1980, 2ND P S DRY PROC, P79