ENERGY-RESOLVED MICROSCOPY USING THE GATAN IMAGING PEELS

Energy filtered images and diffraction patterns have been acquired using a Gatan Imaging-PEELS system mounted on a Hitachi HF-2000 field emission TEM. Initial results are presented showing elemental maps and images of different carbon and alloy phases obtained using plasmon-loss electrons. Coherent diffraction patterns show how interference contrast is reduced but is not entirely absent after electrons have been inelastically scattered.