共 20 条
- [3] INVESTIGATION OF EFFECTIVE-MEDIUM MODELS OF MICROSCOPIC SURFACE-ROUGHNESS BY SPECTROSCOPIC ELLIPSOMETRY [J]. PHYSICAL REVIEW B, 1979, 20 (08): : 3292 - 3302
- [4] NONDESTRUCTIVE CHARACTERIZATION OF INTERFACE LAYERS BETWEEN SI OR GAAS AND THEIR OXIDES BY SPECTROSCOPIC ELLIPSOMETRY [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (05): : 1374 - 1378
- [7] ASPNES DE, 1977, OPTICAL POLARIMETRY, V112, P62
- [8] ASPNES DE, 1980, P S LAS ELECT BEAM P, V80, P414
- [9] BATZ B, 1972, SEMICONDUCT SEMIMET, V9, P315