RADIATION EFFECTS ON FERROELECTRIC THIN-FILM MEMORIES - RETENTION FAILURE MECHANISMS

被引：201

作者：

SCOTT, JF

ARAUJO, CA

MEADOWS, HB

MCMILLAN, LD

SHAWABKEH, A

机构：

[1] UNIV COLORADO, DEPT ELECT ENGN, COLORADO SPRINGS, CO 80933 USA

[2] SYMETRIX CORP, COLORADO SPRINGS, CO 80949 USA

来源：

关键词：

D O I：

10.1063/1.344419

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1444 / 1453

页数：10

共 55 条

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