DETERMINATION OF (N,K) FOR ABSORBING THIN-FILMS USING REFLECTANCE MEASUREMENTS

被引：18

作者：

SIQUEIROS, JM ^{[1
]}

REGALADO, LE ^{[1
]}

MACHORRO, R ^{[1
]}

机构：

[1] UNIV SONORA, CTR INVEST FIS, HERMOSILLO, SONORA, MEXICO

来源：

APPLIED OPTICS | 1988年 / 27卷 / 20期

关键词：

D O I：

10.1364/AO.27.004260

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：4260 / 4264

页数：5

共 18 条

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[3]

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[7] DETERMINATION OF OPTICAL-CONSTANTS OF THIN-FILM COATING MATERIALS BASED ON INVERSE SYNTHESIS [J].

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[8] THIN-FILM COATINGS - ALGORITHMS FOR THE DETERMINATION OF REFLECTANCE AND TRANSMITTANCE, AND THEIR DERIVATIVES [J].

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[9] ON THE DETERMINATION OF THE OPTICAL-CONSTANTS N(LAMBDA) AND ALPHA(LAMBDA) OF THIN SUPPORTED FILMS [J].

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[10]

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