TUNNELING MICROSCOPY ON VARIOUS CARBON MATERIALS

被引：57

作者：

ELINGS, V ^{[1
]}

WUDL, F ^{[1
]}

机构：

[1] UNIV CALIF SANTA BARBARA,INST POLYMERS & ORGAN SOLIDS,SANTA BARBARA,CA 93106

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1988年 / 6卷 / 02期

关键词：

D O I：

10.1116/1.575384

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：412 / 414

页数：3

共 7 条

[1]

BARTH WE, 1971, J AM CHEM SOC, V93, P1730

[2] ENERGY-DEPENDENT STATE-DENSITY CORRUGATION OF A GRAPHITE SURFACE AS SEEN BY SCANNING TUNNELING MICROSCOPY [J].

BINNIG, G ;

FUCHS, H ;

GERBER, C ;

ROHRER, H ;

STOLL, E ;

TOSATTI, E .

EUROPHYSICS LETTERS, 1986, 1 (01) :31-36

[3]

BINNING G, 1932, PHYS REV LETT, V49, P57

[4]

HANSMA PK, 1985, B AM PHYS SOC, V30, P309

[5] TUNNELING MICROSCOPY OF GRAPHITE IN AIR [J].

PARK, SI ;

QUATE, CF .

APPLIED PHYSICS LETTERS, 1986, 48 (02) :112-114

[6] TOPOGRAPHY OF DEFECTS AT ATOMIC RESOLUTION USING SCANNING TUNNELING MICROSCOPY [J].

SALEMINK, HWM ;

BATRA, IP ;

ROHRER, H ;

STOLL, E ;

WEIBEL, E .

SURFACE SCIENCE, 1987, 181 (1-2) :139-144

[7] VOLTAGE-DEPENDENT SCANNING-TUNNELING MICROSCOPY OF A CRYSTAL-SURFACE - GRAPHITE [J].

SELLONI, A ;

CARNEVALI, P ;

TOSATTI, E ;

CHEN, CD .

PHYSICAL REVIEW B, 1985, 31 (04) :2602-2605

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