THICKNESS FLUCTUATIONA AND ELECTRIC FIELD PENETRATION IN THIN METAL-INSULATOR-METAL STRUCTURES

被引:7
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作者
ANTULA, J
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D O I
10.1016/0038-1101(68)90128-7
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TM [电工技术]; TN [电子技术、通信技术];
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0808 ; 0809 ;
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页码:1063 / &
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