THICKNESS FLUCTUATIONA AND ELECTRIC FIELD PENETRATION IN THIN METAL-INSULATOR-METAL STRUCTURES

被引：7
|
作者：
ANTULA, J
机构：
来源：
SOLID-STATE ELECTRONICS | 1968年 / 11卷 / 11期
关键词：
D O I：
10.1016/0038-1101(68)90128-7
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：1063 / &
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