Energy-filtered imaging on a 300kV TEM

被引:0
作者
Bentley, J
Kenik, EA
Evans, ND
Hall, EL
Zinkle, SJ
机构
[1] OAK RIDGE INST SCI & EDUC, OAK RIDGE, TN 37831 USA
[2] GE CO, CORP RES & DEV, SCHENECTADY, NY 12301 USA
来源
ELECTRON MICROSCOPY AND ANALYSIS 1995 | 1995年 / 147卷
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D O I
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中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Some applications of energy-filtered imaging with a Gatan Imaging Filter interfaced to a Philips CM30 TEM operated at 300 kV are described. Aluminum particles <2nm diameter in ion-implanted MgAl2O4 spinel have been detected by imaging with 15eV Al-plasmon-loss electrons. Grain boundary Cr depletion that occurs between Cr-rich M(23)C(6) particles in sensitized type 304L stainless steel has been measured from Cr core-loss images normalized by the low-loss signal and t/lambda to yield Cr atoms/unit volume. Partitioning of Ni between the gamma Ni solid solution matrix and large gamma' [Ni-3(Al,Ti)] particles in Rene 95 Ni-base superalloy has been measured from normalized Ni concentration images.
引用
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页码:187 / 190
页数:4
相关论文
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