MEASUREMENT OF SEMICONDUCTOR CARRIER CONCENTRATION PROFILES

被引：10
作者：
HUGHES, FD
WILSON, M
HEADON, RF
机构：
来源：
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1972年 / 5卷 / 03期
关键词：
D O I：
10.1088/0022-3735/5/3/017
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：241 / &
相关论文
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