ATOMIC-STRUCTURE OF A SIGMA = 21 GRAIN-BOUNDARY

被引：6

作者：

KRAKOW, W

机构：

[1] IBM Research Division, T.J. Watson Research Center, yorktown Heights, New York 10598

来源：

JOURNAL OF MATERIALS RESEARCH | 1990年 / 5卷 / 11期

关键词：

D O I：

10.1557/JMR.1990.2658

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

An electron microscope structure image of a Σ = 21/[111] tilt grain boundary in Au was obtained and atomic column positions identified to yield a structural unit model of the interface consisting of repeating polyhedron shapes. This result represents the smallest projected spacings at a grain boundary containing defect structures imaged by an electron microscope and interpreted atomistically. © 1990, Materials Research Society. All rights reserved.

引用

页码：2658 / 2662

页数：5

共 19 条

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[10] A HIGH-RESOLUTION ELECTRON-MICROSCOPY INVESTIGATION OF SOME LOW-ANGLE AND TWIN BOUNDARY STRUCTURES
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