LATTICE FRINGE IMAGING OF MODULATED STRUCTURES

被引：36

作者：

COCKAYNE, DJH ^{[1
]}

GRONSKY, R ^{[1
]}

机构：

[1] UNIV CALIF BERKELEY LAWRENCE BERKELEY LAB,DIV MAT & MOLEC RES,BERKELEY,CA 94720

来源：

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1981年 / 44卷 / 01期

关键词：

D O I：

10.1080/01418618108244500

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：159 / 175

页数：17

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[4] ELECTRON-MICROSCOPE IMAGE CONTRAST FOR THIN CRYSTALS [J].

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IIJMA, S .

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[5]

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[6]

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[7]

GRONSKY R, 1977, 35TH P ANN EMSA M BO, P116

[8]

Jenkins FA, 1957, FUNDAMENTALS OPTICS

[9]

MCCOWLEY J, 1975, DIFFRACTION PHYSICS

[10]

REZ P, 1978, 9TH P INT C EL MICR, V1, P280

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