XRD-based quantitative analysis of clay minerals using reference intensity ratios, mineral intensity factors, Rietveld, and full pattern summation methods: A critical review

被引:268
作者
Zhou, Xiang [1 ,2 ]
Liu, Dong [1 ]
Bu, Hongling [1 ]
Deng, Liangliang [1 ,2 ]
Liu, Hongmei [1 ]
Yuan, Peng [1 ]
Du, Peixin [1 ,2 ]
Song, Hongzhe [1 ,2 ]
机构
[1] Chinese Acad Sci, Guangdong Prov Key Lab Mineral Phys & Mat, Guangzhou Inst Geochem, CAS Key Lab Mineral & Metallogeny, Guangzhou 510640, Guangdong, Peoples R China
[2] Univ Chinese Acad Sci, Beijing 100049, Peoples R China
基金
中国国家自然科学基金;
关键词
XRD; Quantitative analysis; Clay minerals; RIR and MIF methods; Rietveld and full pattern summation methods;
D O I
10.1016/j.sesci.2017.12.002
中图分类号
P [天文学、地球科学];
学科分类号
07 ;
摘要
The quantification of clay minerals is essential for the evaluation of clay-rich rock and soil, but it remains challenging due to the unique structures and various element compositions of clay minerals. In this article, several quantification methods for clay minerals sourced from X-ray diffraction (XRD) analysis, mainly recommending the reference intensity ratio (RIR), mineral intensity factor (MIF), Rietveld, and full pattern summation methods are reviewed. Principles and applications of these methods are focused upon in addition to related differences in the analysis of clay minerals (i.e., sample preparation, the selection of characteristic reflections for quantification and standards added during analysis). This critical review also provides a proposal for selection of an adaptive XRD quantification method to be applied to various clay-rich samples. Copyright (c) 2018, Guangzhou Institute of Geochemistry. Production and hosting by Elsevier B.V. This is an open access article under the CC BY-NC-ND license.
引用
收藏
页码:16 / 29
页数:14
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