SINGLE-CRYSTAL SILICON-ON-OXIDE BY SCANNING CW LASER LATERAL SEEDING

被引：0
|
作者：
LAM, HW [1 ]
PINIZZOTTO, RF [1 ]
TASCH, AF [1 ]
机构：
[1] TEXAS INSTRUMENTS INC,DALLAS,TX 75222
来源：
JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1980年 / 127卷 / 08期
关键词：
D O I：
暂无
中图分类号：
O646 [电化学、电解、磁化学];
学科分类号：
081704 ;
摘要：
引用
收藏
页码：C391 / C391
页数：1
相关论文
共 50 条
  • [1] SINGLE-CRYSTAL SILICON-ON-OXIDE BY A SCANNING CW LASER-INDUCED LATERAL SEEDING PROCESS
    LAM, HW
    PINIZZOTTO, RF
    TASCH, AF
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1981, 128 (09) : 1981 - 1986
  • [2] DEVICE FABRICATION IN (100) SILICON-ON-OXIDE PRODUCED BY A SCANNING CW-LASER-INDUCED LATERAL SEEDING TECHNIQUE
    LAM, HW
    SOBCZAK, ZP
    PINIZZOTTO, RF
    TASCH, AF
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1982, 29 (03) : 389 - 394
  • [3] Single-crystal germanium layers grown on silicon by nanowire seeding
    Hu, Shu
    Leu, Paul W.
    Marshall, Ann F.
    McIntyre, Paul C.
    NATURE NANOTECHNOLOGY, 2009, 4 (10) : 649 - 653
  • [4] Single-crystal germanium layers grown on silicon by nanowire seeding
    Shu Hu
    Paul W. Leu
    Ann F. Marshall
    Paul C. McIntyre
    Nature Nanotechnology, 2009, 4 : 649 - 653
  • [5] GROWTH OF SINGLE-CRYSTAL SILICON ON BERYLLIUM OXIDE
    MANASEVIT, HM
    FORBES, DH
    CADOFF, IB
    TRANSACTIONS OF THE METALLURGICAL SOCIETY OF AIME, 1966, 236 (03): : 275 - +
  • [6] Growth of niobium oxide films on single-crystal silicon
    V. A. Logacheva
    N. A. Divakova
    Yu. A. Tikhonova
    E. A. Dolgopolova
    A. M. Khoviv
    Inorganic Materials, 2007, 43 : 1230 - 1234
  • [7] Growth of niobium oxide films on single-crystal silicon
    Logacheva, V. A.
    Divakova, N. A.
    Tikhonova, Yu. A.
    Dolgopolova, E. A.
    Khoviv, A. M.
    INORGANIC MATERIALS, 2007, 43 (11) : 1230 - 1234
  • [8] Nanoindentation Characterization of Single-Crystal Silicon with Oxide Film
    Yin, Lianmin
    Dai, Yifan
    Hu, Hao
    SILICON, 2022, 14 (10) : 5173 - 5178
  • [9] Nanoindentation Characterization of Single-Crystal Silicon with Oxide Film
    Lianmin Yin
    Yifan Dai
    Hao Hu
    Silicon, 2022, 14 : 5173 - 5178
  • [10] Miniaturized single-crystal silicon cantilevers for scanning force microscopy
    Yang, JL
    Despont, M
    Drechsler, U
    Hoogenboom, BW
    Frederix, PLTM
    Martin, S
    Engel, A
    Vettiger, P
    Hug, HJ
    APPLIED PHYSICS LETTERS, 2005, 86 (13) : 1 - 3
12345